Electron and Ion Beam Characterization
$49
ENROLL NOWCourse Overview
What You'll Learn
- Electron and ion beams are widely used for both qualitative and quantitative analysis of semiconductor materials and devices.
- They can be used to image structures with sub-nm resolution and to provide information about elemental composition and dopant concentration.
- This course describes the fundamentals of electron and ion beam characterization and includes a project that analyzes the surface roughness of a solar cell.
Electron and ion beams are widely used for both qualitative and quantitative analysis of semiconductor materials and devices. They can be used to image structures with sub-nm resolution and to provide information about elemental composition and dopant concentration. This course describes the fundamentals of electron and ion beam characterization and includes a project that analyzes the surface roughness of a solar cell.
Course FAQs
Is this an accredited online course?
Accreditation for 'Electron and Ion Beam Characterization' is determined by the provider, Arizona State University. For online college courses or degree programs, we strongly recommend you verify the accreditation status directly on the provider's website to ensure it meets your requirements.
Can this course be used for continuing education credits?
Many of the courses listed on our platform are suitable for professional continuing education. However, acceptance for credit varies by state and licensing board. Please confirm with your board and {course.provider} that this specific course qualifies.
How do I enroll in this online school program?
To enroll, click the 'ENROLL NOW' button on this page. You will be taken to the official page for 'Electron and Ion Beam Characterization' on the Arizona State University online class platform, where you can complete your registration.
